of the interferometer for this experiment[1] is shown in Fig. 48. The films are introduced in the path AC, as indicated at
The interferometer is especially useful whenever it is necessary to measure small changes in distance or angle.
In some cases it may be necessary to experiment upon a very small specimen of the material in question, and in such cases the whole change to be measured may be of the order of a ten-thousandth part of an inch—
- ↑ E. S. Johonnott, Phil. Mag. (5), Vol. XLVII (1899), p. 501.